大面积镀膜玻璃离线表面扫描光电检查 ARGUS

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产品价格： < 面议

产品型号：ARGUS

品牌：ZEISS

公司名称：深圳市深科健光谱科技有限公司

所在地：广东深圳

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产品简介

大面积镀膜玻璃离线表面扫描光电检查
ARGUS大面积镀膜玻璃离线表面扫描光电检查设备，测量仪器已安在多滚轴平台上，快速扫描地检查透光率、反射率、镀膜厚度、颜色值差异和面电阻值。离线检查，可作来料、成品检查、半成品抽样检查。

产品详细信息

ARGUS大面积镀膜玻璃离线表面扫描光电检查

测量玻璃镀膜透光率反射率镀膜厚度颜色值差异面电阻值

产品简介

ARGUS大面积镀膜玻璃离线表面扫描光电检查设备，测量仪器已安在多滚轴平台上，快速扫描地检查透光率、反射率、镀膜厚度、颜色值差异和面电阻值。离线检查，可作来料、成品检查、半成品抽样检查。

产品详介

ARGUS³© 5.7大面积镀膜玻璃离线表面扫描光电检查设备，专门为大面积镀膜玻璃检查而设，可处理*大面积2200 x 2600mm 及*大厚度6mm，测量仪器已安在多滚轴平台上，手动平放上玻璃在平台上，可手动选择或自动按已电脑选定的检查点，*快以每两秒一个点续点光谱读数，而电阻则每4秒一个读数。

检测功能包括：透光率、反射率、镀膜厚度、颜色值差异和面电阻值。设备包含一或两个光谱仪CORONA PLUS、光学镜头，电阻四针探头。所有测量头横向移动，玻璃由滚轴转向带动向前，软件按要编制，可与其他软件互接吻，例如：TopFilm©。ARGUS扫描软件提供快速数据处理，快速分析，可靠性高，可直接用于计算镀膜厚度及叠层分析。直接输出至试算表如：EXCEL。

ARGUS软件输出：镀膜厚度、光谱曲线、分析结果曲线(可作调整)、面电阻值、分析结果。

其他功能：扫描路线设计(带预设标淮路线图)，网络联线，预设分析标准曲线图。报告可作数据跟踪，符合ISO9000要求。

特性：

光谱设备：

1. 横阔度 - 约3900mm

2. 扫描的速度 - 每小时1800点

3. 决长范围 - 400-1680nm

4. 精度 - 波长< 0.05 nm

- 透射率< 0.1 % T

- 反射率< 0.1 % R

面电阻设备：

5. 扫描的速度 - 每小时900点

6. 测量电阻范围 - 10 mΩ - 100 Ω ohms

7. 准确度 - ±3 % absolute, ± 1 % relative

8. 灵敏度 - ≤ 1%

9. 位置准确度 - ± 5 mm absolute

10. 位置精度 - ± 1 mm

ARGUS³^© 5.7 is a surface inspection system for measuring and displaying optical and electrical properties of large-surface areas of coated substrate. The system can determine the transmission, reflection, coating thickness, color values and the electrical resistance of the coating. The maximum sample size is 2200 x 2600 mm and the maximum thickness 6 mm.

The ARGUS³^© 5.7 inspection system is equipped with an state-of-the-art spectrometer for analyzing the light transmitted and reflected by the sample and a Keithley source meter for measuring the resistance present on the four-point measuring head. All measuring heads are moved by the Traverse. The sample will be transported by the roller table. The******ponents and tailormade software packages, like TopFilm© and ARGUS software enable the fast and reliable analysis of the electrical and optical properties of the coated glass substrates.

ARGUS³^© 5.7 平面镀膜玻璃光电检测系统

主要功能是测
The maximum sample size is 2200 x 2600 mm and the maximum thickness is 6 mm

Optical measuring system: (光学测量规格)

Up to 1800 points per second for optical measurement(measuring range from 400 to 1680nm)
Up to 900 points per second for optical measurement (measuring range from 400 to 1680nm) and resistance measurement
Measurement spot size approx. 10 mm
Medium spectral pixel spacing 3.3 nm
Wave length accuracy ±1 nm above the wavelength range - 透射 / 反射光谱值
Photometric measuring range 0.2 - 100 %
Reproducibility Y, L*, Δa*, Δb*: ± 0.1 %
Complete spectral range: ± 0.5 %
Color calculation Y, L*, a*, b* (CIELAB) - 颜色值
Light sources A, B, C, D50, D55, D65, D85, D75, F2, G, P TL84,Xe
Standard observation 2°; 10°
Measurable coating thickness Coatings >50 nm with > 20 % transmission - 薄膜厚度

Resistance measurement: (阻力测量规格)

Up to 900 points per second
Measurement diameter approx. 10 mm
Measuring range 10 mΩ - 5 kΩ resistance - 电阻值
Peak radius 150 μm
Load per needle 100 g
Clearance between probe tips 1 mm
Accuracy ± 3 % absolute ± 1 % relative
Sensitivity ≤ 1 %
Measuring current 1 mA, 10 mA, 100 mA or 500 mA
Measurement counter Records the number of measurements (must be reset after being replaced)
Stability X-Y movement of the sensor <20 μm when penetrating the substrate
Position accuracy ± 5 mm
Reproducibility ± 1 mm