应用領域: IC Pattern /电极Pod / Bump /FPP /微机電…等微細观察及立体量測…(more)
12”晶元全行程顯微量測平台
Fast and high-precision measurement in 3-axis of12 inch wafer with Motorized focusing as standard. All area of12inch wafer can be inspected and measured on rotatable stage withhigh performance of UIS optical system.…(more)
12"晶元传送显微检查机
AL110-12 Series 300mm Wafer Manual Inspection System 特色: 1. 操作简易、**有效率 2. FOSB/FOUP/OPEN介面可供选择 3. 特殊目檢照明系統,可依观察需要做選擇,提高辨识力…(more)