TFP-01 Test Finger Probe (IEC试验指)

TFP-01,Test Finger Probe (IEC试验指)

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产品名称：TFP-01,Test Finger Probe (IEC试验指)
产品型号：IEC试验指
产品展商：其它品牌
产品文档：
ED&D TFP-01 Test Finger Probe Brochure

简单介绍

TFP-01,Test Finger Probe (IEC试验指),符合: IEC, EN,CSA,UL标准.(品牌:美国.ED&D) ULP-02,Articulated Probe with Discs(关节试验指),符合UL标准.(品牌:美国.ED&D) ULP-02,Articulated Probe with Discs(UL关节试验指)

产品描述

Model TFP-01: Test Finger Probe(IEC试验指)

This is the “International” test finger required by most IEC, EN and CSA Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements - with integral palm simulator. This is the ONLY Finger Probe available with a integral jack in the handle for continuity testing - as mandated by the IEC CB Scheme. Finger made of chrome plated steel. All parts precision machined.

美国.ED&D产品服务于:IBM ，美国航空暨太空总署，英代尔，苹果， NCR ，索尼公司，太阳，飞利浦公司，思科， AT&T ， Compaq ， JVC ， Hewlett-Packard ，摩托罗拉， Mattel ，戴尔,3 Com 等公司;专为UL ， CSA ， ETL ， TUV,Demko等试验室提供检测产品.

产品目录

产品资料

TFP-01,Test Finger Probe (IEC试验指)