The MarOpto FI 1100 Z interferometer
provides non-contact measurement of flat or spherical surfaces along with
transmitted wavefront measurements of optical components and assem-blies.
Measurements may be made using basic visual fringe inspection, static fringe
analysis, or phase-modulated interfero-gram analysis.
MarOpto FI 1100 Z干涉仪提供非接触式测量平面或球面表面以及传播的波前测量光学组件和装配件。测量可以使用基本的视觉边缘检测、边缘静态分析,或相位调制干涉图的分析。
• Compatible with all industry standard 4" (100mm)
reference optics and accessories
• High accuracy measurements at an affordable price
• Configurations include horizontal, vertical look up and vertical
look down
• Optional workstations for flat and short to long radius
•兼容行业标准4”(100毫米)参考光学及配件
•高准确度测量以一个合理的价格
•配置包括水平、垂直的查找和垂直向下查找
•可选工作站为平面和短到长半径
Applications
• Measurement of flat, concave or convex surfaces
• Prism, corner cube, wedge angle & homogeneity measurements •
Measurement of machined, ceramic, and wafer/disk surfaces • Wavefront analysis
of optical systems & components
• Integration into OEM systems
应用程序
•测量平、凹或凸的表面
•棱镜,角隅棱镜,楔角和同质性测量•加工测量,陶瓷,晶片/磁盘表面•波前分析光学系统和组件
•集成到OEM系统
IntelliWave Software Features
• Phase-shifted or static acquisition and analysis
• Peak-to-Valley, RMS measurements, Strehl Ratio
• Zernike and Seidel analysis
• Diffraction analysis (PSF, MTF, Encircled Energy)
• Geometric analysis (Geometric Spot Diagrams, Encircled Energy) •
Automation for factory floor applications
• Power filtering and averaging features for noisy data
• Interface with IDL™, MS Excel ™, and LabVIEW™
•IntelliPhase – static spatial carrier analysis
IntelliWave软件功能
•相移或静态采集和分析
•Peak-to-Valley,RMS测量,Strehl比率
•泽尼克和塞德尔分析
•衍射分析(PSF、MTF、环绕能源)
•几何分析(几何点图,包围能源)•自动化工厂应用
•电源滤波器和平均噪声数据的特性
•与IDL接口™,MS Excel™,虚拟仪器™
IntelliPhase——静态空间载体的分析
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